On the semilinear equation with an exponential decay memory term

Authors

  • Ali Hakem

DOI:

https://doi.org/10.30495/jme.v18i0.2930

Keywords:

Test functions, lifespan estimates.

Abstract

The main purpose of this paper is to study the non-existence of weak global solutions to the  semi-linear equation with exponential decay memory term. We extend our result to the case of 2 × 2-system of the same type. Our technique of proof is the so-called method of test function.

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Published

2024-09-29

Issue

Section

Vol. 18, No. 5, (2024)